![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US7649141-1.jpg)
Related Industry: Semiconductors
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US7649141-1.jpg)
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US7671610-1.jpg)
Vertical guided probe array providing sideways scrub motion – 7671610
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US7733101-1.jpg)
Knee probe having increased scrub motion – 7733101
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US7759949-1.jpg)
Probes with self-cleaning blunt skates for contacting conductive pads – 7759949
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US7786740-1.jpg)
Probe cards employing probes having retaining portions for potting in a potting region – 7786740
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US7944224-1.jpg)
Low profile probe having improved mechanical scrub and reduced contact inductance – 7944224
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US7952377-1.jpg)
Vertical probe array arranged to provide space transformation – 7952377
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US8111080-1.jpg)
Knee probe having reduced thickness section for control of scrub motion – 8111080
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US8230593-1.jpg)
Probe bonding method having improved control of bonding material – 8230593
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US8203353-1.jpg)
Probes with offset arm and suspension structure – 8203353
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US8324923-1.jpg)
Vertical probe array arranged to provide space transformation – 8324923
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US8415963-1.jpg)
Low profile probe having improved mechanical scrub and reduced contact inductance – 8415963
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US8723546-1.jpg)
Vertical guided layered probe – 8723546
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US8907689-1.jpg)
Probe retention arrangement – 8907689
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US9097740-1.jpg)
Layered Probes with Core – 9097740
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US9121868-1.jpg)
Probes with Offset Arm and Suspension Structure – 9121868
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US9250266-1.jpg)
Probe Bonding Method Having Improved Control of Bonding Material – 9250266
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US9274143-1.jpg)
Vertical Probe Array Arranged to Provide Space Transformation – 9274143
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US9310428-1.jpg)
Probe Retention Arrangement – 9310428
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/US9316670-1.jpg)
Multiple Contact Probes – 9316670
![](https://wp-boomtime.s3.amazonaws.com/peacockmyerspc/patents/img/USRE46221-1.jpg)