Related Industry: Semiconductors
Vertical guided probe array providing sideways scrub motion – 7671610
Knee probe having increased scrub motion – 7733101
Probes with self-cleaning blunt skates for contacting conductive pads – 7759949
Probe cards employing probes having retaining portions for potting in a potting region – 7786740
Low profile probe having improved mechanical scrub and reduced contact inductance – 7944224
Vertical probe array arranged to provide space transformation – 7952377
Knee probe having reduced thickness section for control of scrub motion – 8111080
Probe bonding method having improved control of bonding material – 8230593
Probes with offset arm and suspension structure – 8203353
Vertical probe array arranged to provide space transformation – 8324923
Low profile probe having improved mechanical scrub and reduced contact inductance – 8415963
Vertical guided layered probe – 8723546
Probe retention arrangement – 8907689
Layered Probes with Core – 9097740
Probes with Offset Arm and Suspension Structure – 9121868
Probe Bonding Method Having Improved Control of Bonding Material – 9250266
Vertical Probe Array Arranged to Provide Space Transformation – 9274143
Probe Retention Arrangement – 9310428
Multiple Contact Probes – 9316670
