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Related Industry:
Semiconductors
Emitter wrap-through back contact solar cells on thin silicon wafers – 7649141
Vertical guided probe array providing sideways scrub motion – 7671610
Knee probe having increased scrub motion – 7733101
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Low profile probe having improved mechanical scrub and reduced contact inductance – 7944224
Vertical probe array arranged to provide space transformation – 7952377
Knee probe having reduced thickness section for control of scrub motion – 8111080
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Low profile probe having improved mechanical scrub and reduced contact inductance – 8415963
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Probe retention arrangement – 8907689
Layered Probes with Core – 9097740
Probes with Offset Arm and Suspension Structure – 9121868
Probe Bonding Method Having Improved Control of Bonding Material – 9250266
Vertical Probe Array Arranged to Provide Space Transformation – 9274143
Probe Retention Arrangement – 9310428
Multiple Contact Probes – 9316670
Probe skates for electrical testing of convex pad topologies – RE46,221
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